Nanometrics Inc (NANO) Files Form 4 Insider Selling : Bruce C Rhine Sells 10,000 Shares

Nanometrics Inc (NANO): Bruce C Rhine , director of Nanometrics Inc sold 10,000 shares on Jun 21, 2016. The Insider selling transaction was reported by the company on Jun 23, 2016 to the Securities and Exchange Commission. The shares were sold at $20.08 per share for a total value of $200,800.00 , the company said in a SEC Form 4 Filing.

Other Insider transactions have been reported by the company according to SEC Form 4, on Jun 17, 2016, Stanislaw M. Borowicz (Senior VP, Sales) sold 209 shares at $18.68 per share price.On May 4, 2016, Bruce C Rhine (director) sold 13,014 shares at $17.85 per share price.Also, On Apr 4, 2016, Kevin Heidrich (Senior VP, Marketing) sold 20,000 shares at $15.41 per share price.On Aug 12, 2015, Timothy J Stultz (President & CEO) sold 11,111 shares at $14.53 per share price.

Nanometrics Incorporated: On Tuesday, Jun 21, 2016 heightened volatility was witnessed in Nanometrics Incorporated which led to swings in the share price. The shares opened for trading at $19.84 and hit $20.64 on the upside , eventually ending the session at $20.49, with a gain of 6.50% or 1.25 points. The heightened volatility saw the trading volume jump to 4,40,205 shares. The 52-week high of the share price is $20.64 and the company has a market cap of $500 M . The 52-week low of the share price is at $11.91.

Nanometrics Incorporated Money Flow Index Chart

Company has been under the radar of several Street Analysts.Nanometrics Incorporated is Reiterated by The Benchmark Company to Buy and the brokerage firm has raised the Price Target to $ 24 from a previous price target of $18.50 .The Rating was issued on Apr 27, 2016.

Nanometrics Incorporated (Nanometrics) provides process control metrology and inspection systems used in the fabrication of integrated circuits high-brightness LEDs (HB-LED) discrete components and data storage devices. The Company’s automated and integrated systems address numerous process control applications including critical dimension and film thickness measurement device topography defect inspection and analysis of various other film properties such as optical electrical and material characteristics. The Company’s process control solutions are deployed throughout the fabrication process from front-end-of-line substrate manufacturing to high-volume production of semiconductors and other devices to advanced wafer-scale packaging applications. The Company offers a diverse line of process control and inspection products and technologies to address the manufacturing requirements of the semiconductor (and other solid state device) manufacturing industry.

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