Nanometrics Incorporated (NANO) was Reiterated by Stifel to “Buy” according to the research note released today. The brokerage firm has raised the Price Target to $ 25 from a previous price target of $21 . Stifel advised their investors in a research report released on Jun 27, 2016.
Many Wall Street Analysts have commented on Nanometrics Incorporated. Company shares were Reiterated by The Benchmark Company on Apr 27, 2016 to “Buy”, Firm has raised the Price Target to $ 24 from a previous price target of $18.50 .
On the company’s financial health, Nanometrics Incorporated reported $0.16 EPS for the quarter, beating the analyst consensus estimate by $ 0.10 according to the earnings call on Apr 26, 2016. Analyst had a consensus of $0.06. The company had revenue of $47.49 million for the quarter, compared to analysts expectations of $46.25 million. The company’s revenue was down -5.7 % compared to the same quarter last year.During the same quarter in the previous year, the company posted $0.14 EPS.
Nanometrics Incorporated closed down -0.42 points or -2.04% at $20.2 with 9,42,741 shares getting traded on Friday. Post opening the session at $19.87, the shares hit an intraday low of $18.81 and an intraday high of $20.22 and the price fluctuated in this range throughout the day.Shares ended Friday session in Red.
In a different news, on Jun 23, 2016, Bruce C Rhine (director) sold 10,000 shares at $20.08 per share price. According to the SEC, on Jun 17, 2016, Stanislaw M. Borowicz (Senior VP, Sales) sold 209 shares at $18.68 per share price. On Apr 4, 2016, Kevin Heidrich (Senior VP, Marketing) sold 20,000 shares at $15.41 per share price, according to the Form-4 filing with the securities and exchange commission.
Nanometrics Incorporated (Nanometrics) provides process control metrology and inspection systems used in the fabrication of integrated circuits high-brightness LEDs (HB-LED) discrete components and data storage devices. The Company’s automated and integrated systems address numerous process control applications including critical dimension and film thickness measurement device topography defect inspection and analysis of various other film properties such as optical electrical and material characteristics. The Company’s process control solutions are deployed throughout the fabrication process from front-end-of-line substrate manufacturing to high-volume production of semiconductors and other devices to advanced wafer-scale packaging applications. The Company offers a diverse line of process control and inspection products and technologies to address the manufacturing requirements of the semiconductor (and other solid state device) manufacturing industry.